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Analysis of Operation Errors for Fault Injection Attack

Masaya Yoshikawa and Hikaru Goto
Dept. of information engineering Meijo University, Nagoya, Japan
Abstract—Although the encryption standards are theoretically safe, it has been recently reported that confidential information could be illegally revealed when the encryption standards are embedded in the electronic devices. In particular, the menace posed by fault injection attacks has become extremely serious. To guarantee the safety of electronic devices in the future, into which cryptographic circuits have been incorporated, fault injection attacks must be thoroughly studied. This study elucidates the tendency of fault injection.

Index Terms—fault injection attack, tendency of an operation error, glitch generation, tamper resistance, advanced encryption standard

Cite: Masaya Yoshikawa and Hikaru Goto, "Analysis of Operation Errors for Fault Injection Attack," International Journal of Signal Processing Systems, Vol. 2, No. 1, pp. 74-77, June 2014. doi: 10.12720/ijsps.2.1.74-77
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